Laser Scanning Microscope for Metrology
CSEM is a privately held, R&D center established in 1984 in Neuchâtel, Switzerland. From the beginning, CSEM has been committed to both applied and order-related R&D. This bridge function between economics and science is still a core aspect of the company, and CSEM has continuously adapted its research areas to the needs of industry.
[TECHNICAL] DEVELOPMENT SUPPORT
DEVELOPMENT SUPPORT [Characterization testing /services] Optical, electronics, mechanics
PC1 Integrated circuits
PC5 Active components
Non Photonic Peripherals
IN1 Fiber/waveguide coupling
IN2 Optical assembly
IN3 Component assembly
IN4 Surface activation
PP1 Over moulding
PP2 Hermetic sealing
PP3 Opto fluidic interface
PP4 Thin film deposition
"[Characterization testing /services] Optical, electronics, mechanics"
Non technical services
Field of application
in vitro diagnostics
in vivo diagnostics
Target customers / applications
The Keyence Laser Scanning Microscope (LSM) is a professional tool able to combine high quality imaging together with laser-based high-precision metrology. It can be used for several purpose alike characterization of optical surfaces, metrology and roughness investigations of cnc/laser-milled substrates, characterization of MEMS/MOEMS planarity and/or layer thicknesses and many other investigations too.
Keyence Laser Scanning Microscope (VKX-100)
Long working distance objectives
Automated stage XY and Z
Software for stitching and metrology analysis
Software for comparing product batch results
Offering Reports description
The Keyence Laser Scanning Microscope (LSM) is a professional tool able to combine high quality imaging together with laser-based high-precision metrology. It can be used for several purpose alike characterization of optical surfaces, metrology/roughness investigations of cnc/laser-milled substrates
CSEM DS3 0008 V1.0
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Link to Organization registry
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